Invention Grant
- Patent Title: Method and apparatus for handling an interrupt during testing of a data processing system
- Patent Title (中): 在数据处理系统测试期间处理中断的方法和装置
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Application No.: US12748096Application Date: 2010-03-26
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Publication No.: US08335881B2Publication Date: 2012-12-18
- Inventor: David M. Welguisz , Gary R. Morrison
- Applicant: David M. Welguisz , Gary R. Morrison
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Joanna G. Chiu; David G. Dolezal
- Main IPC: G06F13/24
- IPC: G06F13/24
Abstract:
A method for handling an interrupt during testing of at least one logic block of a processor includes performing a test on at least one logic block of a processor; during the performing, receiving an interrupt; determining a progress status of the test in response to receiving the interrupt; and determining when the processor responds to an interrupt, wherein the determining when the processor responds to an interrupt is based on the progress of the test.
Public/Granted literature
- US20110238878A1 METHOD AND APPARATUS FOR HANDLING AN INTERRUPT DURING TESTING OF A DATA PROCESSING SYSTEM Public/Granted day:2011-09-29
Information query
