A method of executing a wear leveling operation within a non-volatile memory including a single-level memory cell block (SLC) and a multi-level memory cell block (MLC) is disclosed. The method includes calculating an average erase point in relation to a number of programming/erase (P/E) operations applied to a logical block address (LBA), a SLC mode usage point in relation to a number of the P/E operations applied to the SLC, a MLC mode usage point in relation to a number of the P/E operations applied to the MLC, and a wear value in relation to the average erase point, the SLC mode usage point, and the MLC mode usage point; and then if the wear value exceeds a defined threshold value, performing the wear leveling operation.