Invention Grant
- Patent Title: Automatic testing apparatus
- Patent Title (中): 自动检测仪器
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Application No.: US12701828Application Date: 2010-02-08
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Publication No.: US08335944B2Publication Date: 2012-12-18
- Inventor: Chuanguo Zhang , Yuxi Chen , Shiping Wu
- Applicant: Chuanguo Zhang , Yuxi Chen , Shiping Wu
- Applicant Address: TW Taipei Hsien
- Assignee: Wistron Corporation
- Current Assignee: Wistron Corporation
- Current Assignee Address: TW Taipei Hsien
- Agency: Sinorica, LLC
- Agent Ming Chow
- Priority: CN200910157998 20090721
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
The present invention relates to an automatic testing apparatus, which comprises a device under test and a testing module. The device under test has a testing program and includes a plurality of functional modules. The testing module is coupled to the device under test. The device under test executes a testing program and communicates with the testing module so that the testing module can test the plurality of functional modules of the device under test. By adopting automatic testing, no tester is needed for performing testing. Thereby, the personnel cost can be reduced and the total testing time can be shortened.
Public/Granted literature
- US20110022892A1 AUTOMATIC TESTING APPARATUS Public/Granted day:2011-01-27
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