Invention Grant
US08339703B2 Scanning microscope and method for manipulating samples by means of a manipulating light beam in a scanning microscope 有权
扫描显微镜和在扫描显微镜中通过操纵光束操作样品的方法

  • Patent Title: Scanning microscope and method for manipulating samples by means of a manipulating light beam in a scanning microscope
  • Patent Title (中): 扫描显微镜和在扫描显微镜中通过操纵光束操作样品的方法
  • Application No.: US12088416
    Application Date: 2006-09-27
  • Publication No.: US08339703B2
    Publication Date: 2012-12-25
  • Inventor: Werner Knebel
  • Applicant: Werner Knebel
  • Applicant Address: DE Wetzlar
  • Assignee: Leica Microsystems CMS GmbH
  • Current Assignee: Leica Microsystems CMS GmbH
  • Current Assignee Address: DE Wetzlar
  • Agency: Leydig, Voit & Mayer, Ltd.
  • Priority: DE102005046638 20050929
  • International Application: PCT/EP2006/066782 WO 20060927
  • International Announcement: WO2007/036531 WO 20070405
  • Main IPC: G02B21/06
  • IPC: G02B21/06
Scanning microscope and method for manipulating samples by means of a manipulating light beam in a scanning microscope
Abstract:
A scanning microscope for manipulating a sample, the microscope, having a first light source, a second light source, a beam deflector, and an optical device. The first light source is configured to emit an illuminating light beam that follows an illuminating beam. A second light source is configured to produce a manipulating light beam which has a manipulating beam focus and follows a manipulating beam path. The beam deflection device is configured to guide the illuminating light beam and the manipulating beam focus over or through the sample. The optical device is disposed downstream of the second light in the manipulating beam and is configured to modify the size of the manipulating beam focus.
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