Invention Grant
US08340167B2 Method and apparatus for measuring and correcting receiver parameters
有权
用于测量和校正接收机参数的方法和装置
- Patent Title: Method and apparatus for measuring and correcting receiver parameters
- Patent Title (中): 用于测量和校正接收机参数的方法和装置
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Application No.: US12544596Application Date: 2009-08-20
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Publication No.: US08340167B2Publication Date: 2012-12-25
- Inventor: Shen Feng , Gang Hu , Yuanfei Nie , Meiwu Wu , Yu Chen , Xiaomin Si , Yiu Leechung
- Applicant: Shen Feng , Gang Hu , Yuanfei Nie , Meiwu Wu , Yu Chen , Xiaomin Si , Yiu Leechung
- Applicant Address: CN Shanghai
- Assignee: Montage Technology (Shanghai) Co., Ltd.
- Current Assignee: Montage Technology (Shanghai) Co., Ltd.
- Current Assignee Address: CN Shanghai
- Agency: Jun He Law Offices P.C.
- Agent James J. Zhu
- Priority: CN200910055538 20090729
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B17/00 ; H04Q1/20

Abstract:
A method and apparatus for measuring parameters of a receiver having a mixer for generating an I signal and a Q signal using an input signal, an I channel circuit for processing the I signal, and a Q channel circuit for processing the Q signal. The method includes feeding the receiver a first testing signal before the mixer. The method includes feeding the receiver a second testing signal on the I channel circuit. The method includes feeding the receiver a third testing signal on the Q channel circuit. The method includes measuring I/Q quadrature deviation and I/Q delay imbalance of the receiver using the first, the second, and the third testing signals. This separates the I/Q quadrature deviation and I/Q delay imbalance.
Public/Granted literature
- US20110026570A1 METHOD AND APPARATUS FOR MEASURING AND CORRECTING RECEIVER PARAMETERS Public/Granted day:2011-02-03
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