Invention Grant
US08340437B2 Methods and systems for determining optimal features for classifying patterns or objects in images
有权
用于确定图像中图案或物体分类的最佳特征的方法和系统
- Patent Title: Methods and systems for determining optimal features for classifying patterns or objects in images
- Patent Title (中): 用于确定图像中图案或物体分类的最佳特征的方法和系统
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Application No.: US12601784Application Date: 2008-05-29
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Publication No.: US08340437B2Publication Date: 2012-12-25
- Inventor: Michael Abràmoff , Pete Soliz , Stephen Russell
- Applicant: Michael Abràmoff , Pete Soliz , Stephen Russell
- Applicant Address: US IA Iowa City
- Assignee: University of Iowa Research Foundation
- Current Assignee: University of Iowa Research Foundation
- Current Assignee Address: US IA Iowa City
- Agency: Ballard Spahr LLP
- International Application: PCT/US2008/065043 WO 20080529
- International Announcement: WO2008/150840 WO 20081211
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/46
Abstract:
Provided are methods for determining optimal features for classifying patterns or objects. Also provided are methods for image analysis. Further provided are methods for image searching.
Public/Granted literature
- US20100220906A1 METHODS AND SYSTEMS FOR DETERMINING OPTIMAL FEATURES FOR CLASSIFYING PATTERNS OR OBJECTS IN IMAGES Public/Granted day:2010-09-02
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