Invention Grant
US08340457B2 Image analysis method, image analysis program and pixel evaluation system having the sames
有权
图像分析方法,图像分析程序和具有sames的像素评估系统
- Patent Title: Image analysis method, image analysis program and pixel evaluation system having the sames
- Patent Title (中): 图像分析方法,图像分析程序和具有sames的像素评估系统
-
Application No.: US13162602Application Date: 2011-06-17
-
Publication No.: US08340457B2Publication Date: 2012-12-25
- Inventor: Masahiko Hayakawa , Tatsuji Nishijima
- Applicant: Masahiko Hayakawa , Tatsuji Nishijima
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2004-122618 20040419
- Main IPC: G06K9/42
- IPC: G06K9/42

Abstract:
The present invention provides an image analysis method and an image analysis program having a feature of carrying out a panel display quality evaluation at low cost and short time with relieved influence of moire by treating a value, which is obtained by recognizing a coordinate of a panel pixel in a shot image based on an image for detecting a coordinate and positional information thereof with high accuracy and by calculating average luminance by panel pixel unit based on a center position of a coordinate, as representative luminance in each pixel of the panel, in a panel evaluation method of shooting an image display panel with a digital camera.
Public/Granted literature
- US20110243475A1 IMAGE ANALYSIS METHOD, IMAGE ANALYSIS PROGRAM AND PIXEL EVALUATION SYSTEM HAVING THE SAMES Public/Granted day:2011-10-06
Information query