Invention Grant
- Patent Title: Microprocessor and method for detecting faults therein
- Patent Title (中): 用于检测故障的微处理器和方法
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Application No.: US13242906Application Date: 2011-09-23
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Publication No.: US08341473B2Publication Date: 2012-12-25
- Inventor: Valeria Bertacco , Todd Michael Austin , Smitha Shyam , Kypros Constantinides , Sujay Phadke
- Applicant: Valeria Bertacco , Todd Michael Austin , Smitha Shyam , Kypros Constantinides , Sujay Phadke
- Applicant Address: US MI Ann Arbor
- Assignee: The Regents of the University of Michigan
- Current Assignee: The Regents of the University of Michigan
- Current Assignee Address: US MI Ann Arbor
- Agency: Brooks Kushman P.C.
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A microprocessor has a silicon area comprising a plurality of transistors implemented on the silicon area and a fault detection circuit occupying less than 20% of the silicon area and configured to detect faults at runtime in at least 80% of the plurality of transistors.
Public/Granted literature
- US20120011422A1 MICROPROCESSOR AND METHOD FOR DETECTING FAULTS THEREIN Public/Granted day:2012-01-12
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