Invention Grant
- Patent Title: Method for detecting short burst errors in LDPC system
- Patent Title (中): 用于检测LDPC系统中短脉冲串错误的方法
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Application No.: US13469746Application Date: 2012-05-11
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Publication No.: US08341495B2Publication Date: 2012-12-25
- Inventor: Weijun Tan , Shaohua Yang , Hongwei Song
- Applicant: Weijun Tan , Shaohua Yang , Hongwei Song
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Suiter Swantz pc llo
- Main IPC: H03M13/00
- IPC: H03M13/00 ; H03M13/03

Abstract:
The present invention is a device for detecting short burst errors. The device includes a first signal input, wherein the first signal input is configured to receive a first signal. The device includes a second signal input, wherein the second signal input is configured to receive a second signal. The device includes a logic gate, wherein the logic gate is operable for receiving the first signal via the first signal input, receiving the second signal via the second signal input, and generating a logic output gate signal based on the received first signal and the second signal. Furthermore, the device includes a filter, wherein the filter is configured for receiving the logic output gate signal from the logic gate and generates a filter output signal based upon the received logic output gate signal, wherein the filter output signal is operable for flagging errors.
Public/Granted literature
- US20120226958A1 METHOD FOR DETECTING SHORT BURST ERRORS IN LDPC SYSTEM Public/Granted day:2012-09-06
Information query
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