Invention Grant
- Patent Title: Methods of arranging mask patterns and associated apparatus
- Patent Title (中): 布置掩模图案和相关设备的方法
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Application No.: US12968178Application Date: 2010-12-14
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Publication No.: US08341561B2Publication Date: 2012-12-25
- Inventor: Dong-woon Park , Woo-sung Han , Seong-woon Choi , Jeong-ho Yeo
- Applicant: Dong-woon Park , Woo-sung Han , Seong-woon Choi , Jeong-ho Yeo
- Applicant Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Muir Patent Consulting, PLLC
- Priority: KR10-2006-0126379 20061212
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Methods and apparatus are disclosed that arrange mask patterns in response to the contribution of a second pattern to image intensity. In some methods of arranging mask patterns, a distribution of functions h(ξ−x) is obtained which represents the contribution of a second pattern to image intensity on a first pattern. Neighboring regions of the first pattern are discretized into finite regions, and the distribution of the functions h(ξ−x) is replaced with representative values h(x,ξ) of the discretized regions. A position of the second pattern is determined using polygonal regions having the same h(x,ξ). As described, the term x is the position of the first pattern and the term ξ is the position of the assist.
Public/Granted literature
- US20110119644A1 METHODS OF ARRANGING MASK PATTERNS AND ASSOCIATED APPARATUS Public/Granted day:2011-05-19
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