Invention Grant
- Patent Title: Inspection apparatus for sensor element, and method for inspecting electrical characteristics of sensor element
- Patent Title (中): 传感元件检测装置及检测传感元件电气特性的方法
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Application No.: US12987220Application Date: 2011-01-10
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Publication No.: US08342002B2Publication Date: 2013-01-01
- Inventor: Hiroyuki Shindo , Kiyotaka Sugiura
- Applicant: Hiroyuki Shindo , Kiyotaka Sugiura
- Applicant Address: JP Nagoya JP Komaki
- Assignee: NGK Insulators, Ltd.,NGK Ceramic Device Co., Ltd.
- Current Assignee: NGK Insulators, Ltd.,NGK Ceramic Device Co., Ltd.
- Current Assignee Address: JP Nagoya JP Komaki
- Agency: Burr & Brown
- Priority: JP2010-007732 20100118
- Main IPC: G01N1/21
- IPC: G01N1/21

Abstract:
An inspection apparatus including a cylindrical chamber having an opening part and a bottomed end part. The chamber includes an element insertion/extraction part, a tapered part, and a gas introduction part. The element insertion/extraction part is a tubular space continuous from the opening part. The tapered part is connected to the element insertion/extraction part, and is a space having a tapered shape in a cross-sectional view sectioned perpendicularly so that a lengthwise direction is larger toward the inner side. The gas introduction part is a tubular space continuously extending from the tapered part to a bottom portion. A sensor element is inserted into the chamber such that a front end thereof reaches the tapered part while a gap is formed between the sensor element and the chamber, and in this condition, an inspection gas is supplied to the chamber through a supply port provided in the gas introduction part.
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