Invention Grant
- Patent Title: Coating/developing apparatus and coating/developing method
- Patent Title (中): 涂布/显影装置和涂布/显影方法
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Application No.: US12859559Application Date: 2010-08-19
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Publication No.: US08342761B2Publication Date: 2013-01-01
- Inventor: Nobuaki Matsuoka
- Applicant: Nobuaki Matsuoka
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Ableman, Frayne & Schwab
- Priority: JP2009-193387 20090824
- Main IPC: G03D5/00
- IPC: G03D5/00

Abstract:
Disclosed is an coating/developing apparatus and method thereof in which the processing time is shortened and the foot prints is reduced by shortening the travel distance of a wafer transfer arm. The coating/developing apparatus of the present disclosure includes, inter alia, liquid processing part (COT) that processes the substrate using a liquid, a cooling processing part (CA) provided to correspond to the liquid processing part (COT) and perform the cooling process for the substrate, a liquid processing unit (COTU) provided to correspond to the cooling processing part (CA) and equipped with a heating processing part (HP) that performs a heating processing for the substrate. The cooling processing part (CA) transfers the substrate to/from the liquid processing part (COT) and the heating processing part (HP).
Public/Granted literature
- US20110043773A1 COATING/DEVELOPING APPARATUS AND COATING/DEVELOPING METHOD Public/Granted day:2011-02-24
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