Invention Grant
- Patent Title: Automatic analyzer
- Patent Title (中): 自动分析仪
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Application No.: US12336968Application Date: 2008-12-17
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Publication No.: US08343423B2Publication Date: 2013-01-01
- Inventor: Hiroki Mori , Yasuo Kaneko , Toshihide Orihashi
- Applicant: Hiroki Mori , Yasuo Kaneko , Toshihide Orihashi
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2008-046172 20080227
- Main IPC: G01N35/10
- IPC: G01N35/10

Abstract:
A diluted sample is reused to remeasure a sample whose measurement has been completed, which is to be manually performed. An automatic analyzer can set hold and discard conditions and manage the elapsed time after a diluted sample is pipetted. It is possible to check, before measurement is performed, whether or not each requested measurement item can be measured, and the length of time it takes before measurement of all samples is completed. The automatic analyzer has functions of: setting diluted sample hold and discard conditions; allowing an operator to specify a kind of sample, for example, to select between a parent sample and a diluted sample; separately executing pipetting or measurement; and displaying each requested measurement item for which a sample or a reagent is insufficient, and displaying the length of time it takes until measurement of all samples is completed.
Public/Granted literature
- US20090214385A1 AUTOMATIC ANALYZER Public/Granted day:2009-08-27
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