Invention Grant
- Patent Title: Analysis device with an array of focusing microstructures
- Patent Title (中): 具有聚焦微结构阵列的分析装置
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Application No.: US12097082Application Date: 2006-12-15
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Publication No.: US08343424B2Publication Date: 2013-01-01
- Inventor: Peter Dirksen , Yuri Aksenov , Fredericus Christiaan Van Den Heuvel , Johannes Arnoldus Jacobus Maria Kwinten
- Applicant: Peter Dirksen , Yuri Aksenov , Fredericus Christiaan Van Den Heuvel , Johannes Arnoldus Jacobus Maria Kwinten
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP05112195 20051215
- International Application: PCT/IB2006/054882 WO 20061215
- International Announcement: WO2007/069222 WO 20070621
- Main IPC: G01N21/01
- IPC: G01N21/01
Abstract:
A device includes first and second material facing towards each other as to form at least one focusing microstructure with a focal point located outside of the first material.
Public/Granted literature
- US20080305970A1 Analysis Device with an Array of Focusing Microstructures Public/Granted day:2008-12-11
Information query
