Invention Grant
- Patent Title: Specimen processing device, specimen conveyance device, and specimen conveyance method
- Patent Title (中): 试样处理装置，试样输送装置和试样输送方法
-
Application No.: US13399477Application Date: 2012-02-17
-
Publication No.: US08343772B2Publication Date: 2013-01-01
- Inventor: Hiroyuki Tanaka
- Applicant: Hiroyuki Tanaka
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2008-259267 20081006
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/00
Abstract:
A specimen processing device comprising: a specimen processing unit for processing specimens; a first conveyance mechanism for conveying specimens from a carry-in side towards a carry-out side on the opposite side of the carry-in side with respect to the specimen processing unit through a specimen supply position for supplying specimens to the specimen processing unit; a second conveyance mechanism for conveying specimens from the carry-in side towards the carry-out side without passing the specimen supply position; a first control device for controlling the first conveyance mechanism; and a second control device for controlling the second conveyance mechanism, is disclosed. A specimen conveyance device and a specimen conveyance method are also disclosed.
Public/Granted literature
- US20120148447A1 SPECIMEN PROCESSING DEVICE, SPECIMEN CONVEYANCE DEVICE, AND SPECIMEN CONVEYANCE METHOD Public/Granted day:2012-06-14
Information query
