Invention Grant
US08343820B2 Method for fabricating vertical channel type non-volatile memory device
有权
垂直通道型非易失性存储器件的制造方法
- Patent Title: Method for fabricating vertical channel type non-volatile memory device
- Patent Title (中): 垂直通道型非易失性存储器件的制造方法
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Application No.: US12624966Application Date: 2009-11-24
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Publication No.: US08343820B2Publication Date: 2013-01-01
- Inventor: Young-Kyun Jung
- Applicant: Young-Kyun Jung
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2009-0084157 20090907
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A method for fabricating a vertical channel type non-volatile memory device including a plurality of memory cells stacked along channels protruding from a substrate includes: alternately forming a plurality of first material layers and a plurality of second material layers over the substrate; forming a buffer layer over the substrate with the plurality of the first material layers and the plurality of the second material layers formed thereon; forming trenches by etching the buffer layer, the plurality of the second material layers, and the plurality of the first material layers; forming a material layer for channels over the substrate to fill the trenches; and forming the channels by performing a planarization process until a surface of the buffer layer is exposed.
Public/Granted literature
- US20110059595A1 METHOD FOR FABRICATING VERTICAL CHANNEL TYPE NON-VOLATILE MEMORY DEVICE Public/Granted day:2011-03-10
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