Invention Grant
US08344477B2 Semiconductor chip, semiconductor wafer, method of manufacturing semiconductor chip
失效
半导体芯片,半导体晶圆,制造半导体芯片的方法
- Patent Title: Semiconductor chip, semiconductor wafer, method of manufacturing semiconductor chip
- Patent Title (中): 半导体芯片,半导体晶圆,制造半导体芯片的方法
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Application No.: US12801054Application Date: 2010-05-19
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Publication No.: US08344477B2Publication Date: 2013-01-01
- Inventor: Masafumi Yamaji
- Applicant: Masafumi Yamaji
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2009-154733 20090630
- Main IPC: H01L23/52
- IPC: H01L23/52

Abstract:
One exemplary embodiment includes a semiconductor chip that has a rectangle principal surface including a first and a second side that oppose each other. A first and a second semiconductor element, and a first and a second wire are formed on the principal surface. The first wire is formed from the first side to reach the second side, and coupled to the first semiconductor element. The second wire is formed to contact at least the first wire, and coupled to the second semiconductor element. Further, an edge part of the first wire on the second side and an edge part of the second wire on the first side are placed to substantially position on a common straight line which is vertical to the first and the second sides.
Public/Granted literature
- US20100327403A1 Semiconductor chip, semiconductor wafer, method of manufacturing semiconductor chip Public/Granted day:2010-12-30
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