Invention Grant
- Patent Title: Etching apparatus and etching method for substrate bevel
- Patent Title (中): 蚀刻设备和蚀刻方法用于衬底斜面
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Application No.: US12939684Application Date: 2010-11-04
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Publication No.: US08344482B2Publication Date: 2013-01-01
- Inventor: Shin-ichi Imai
- Applicant: Shin-ichi Imai
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-125936 20060428
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L29/06 ; H05H1/00 ; B44C1/22 ; C03C15/00 ; C03C25/68 ; C23F1/00

Abstract:
In the bevel etching apparatus relating to the present invention, a substrate is inserted between electrically connected electrodes. A high-frequency power source is connected to the electrodes, and ground potential is applied to a support unit that supports the substrate. Gas (atmosphere) is supplied to the gap between the electrodes and the application of the high-frequency electric power to the electrodes causes the generation of atmospheric-pressure glow discharge between the electrode and the substrate. Bevel etching is performed by rotating the substrate along the circumferential direction in this condition. According to this construction, the bevel etching can be simultaneously performed to the front surface, the rear surface and the side of the substrate without causing any configuration change in the substrate.
Public/Granted literature
- US20110042007A1 ETCHING APPARATUS AND ETCHING METHOD FOR SUBSTRATE BEVEL Public/Granted day:2011-02-24
Information query
IPC分类: