Invention Grant
- Patent Title: Multi-die building block for stacked-die package
- Patent Title (中): 用于堆叠式封装的多芯片构建块
-
Application No.: US12347738Application Date: 2008-12-31
-
Publication No.: US08344491B2Publication Date: 2013-01-01
- Inventor: Ravikumar Adimula , Myung Jin Yim
- Applicant: Ravikumar Adimula , Myung Jin Yim
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: H01L23/02
- IPC: H01L23/02

Abstract:
A multi-die building block for a stacked-die package is described. The multi-die building block includes a flex tape having a first surface and a second surface, each surface including a plurality of electrical traces. A first die is coupled, through a first plurality of interconnects, to the plurality of electrical traces of the first surface of the flex tape. A second die is coupled, through a second plurality of interconnects, to the plurality of electrical traces of the second surface of the flex tape.
Public/Granted literature
- US20100164085A1 MULTI-DIE BUILDING BLOCK FOR STACKED-DIE PACKAGE Public/Granted day:2010-07-01
Information query
IPC分类: