Invention Grant
- Patent Title: Probe unit
- Patent Title (中): 探头单元
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Application No.: US12735598Application Date: 2009-01-22
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Publication No.: US08344747B2Publication Date: 2013-01-01
- Inventor: Toshio Kazama , Kohei Hironaka , Shigeki Ishikawa
- Applicant: Toshio Kazama , Kohei Hironaka , Shigeki Ishikawa
- Applicant Address: JP Yokohama-Shi
- Assignee: NHK Spring Co., Ltd.
- Current Assignee: NHK Spring Co., Ltd.
- Current Assignee Address: JP Yokohama-Shi
- Agency: Edwards Wildman Palmer LLP
- Agent James E. Armstrong, IV; Stephen D. LeBarron
- Priority: JP2008-023167 20080201
- International Application: PCT/JP2009/050999 WO 20090122
- International Announcement: WO2009/096318 WO 20090806
- Main IPC: G01R1/067
- IPC: G01R1/067 ; H01R12/00

Abstract:
A probe unit includes: large diameter probes; small diameter probes; a large-diameter probe holder having large hole portions which individually hold the large diameter probes, and reception hole portions which have diameters smaller than those of the large hole portions, communicate with the large hole portions, and receive end portions of the small diameter probes so that the end portions come into contact with the large diameter; and a small-diameter probe holder probes having small hole portions which individually hold the small diameter probes. The central axes of the large hole portion and the small hole portion that communicate with each other are separated from each other, and the small hole portions include two small hole portions which are adjacent to each other and of which central axes are separated from each other by a distance shorter than a distance between the central axes of two large hole portions that are corresponding to the two small hole portions.
Public/Granted literature
- US20110025358A1 PROBE UNIT Public/Granted day:2011-02-03
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