Invention Grant
- Patent Title: Surface-plasmon detector based on a field-effect transistor
- Patent Title (中): 基于场效应晶体管的表面等离子体检测器
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Application No.: US12054640Application Date: 2008-03-25
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Publication No.: US08344750B2Publication Date: 2013-01-01
- Inventor: Girsh Blumberg
- Applicant: Girsh Blumberg
- Applicant Address: FR Paris
- Assignee: Alcatel Lucent
- Current Assignee: Alcatel Lucent
- Current Assignee Address: FR Paris
- Agency: Mendelsohn, Drucker & Associates, P.C.
- Agent Yuri Gruzdkov; Steve Mendelsohn
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/26

Abstract:
According to one embodiment, a surface-plasmon (SP) beam generated by an SP source and directed via an SP waveguide is applied to a gate node of a field-effect transistor (FET). The FET also has a source node and a drain node. In a representative configuration, the gate, source, and drain nodes are electrically biased to pass an electrical current between the source and drain nodes in a manner that makes the electrical current responsive to the intensity of the SP beam.
Public/Granted literature
- US20090243589A1 SURFACE-PLASMON DETECTOR BASED ON A FIELD-EFFECT TRANSISTOR Public/Granted day:2009-10-01
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