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US08344750B2 Surface-plasmon detector based on a field-effect transistor 有权
基于场效应晶体管的表面等离子体检测器

Surface-plasmon detector based on a field-effect transistor
Abstract:
According to one embodiment, a surface-plasmon (SP) beam generated by an SP source and directed via an SP waveguide is applied to a gate node of a field-effect transistor (FET). The FET also has a source node and a drain node. In a representative configuration, the gate, source, and drain nodes are electrically biased to pass an electrical current between the source and drain nodes in a manner that makes the electrical current responsive to the intensity of the SP beam.
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