Invention Grant
US08344771B2 Delay locked loop of semiconductor integrated circuit and method for driving the same 失效
半导体集成电路的延迟锁定环路及其驱动方法

  • Patent Title: Delay locked loop of semiconductor integrated circuit and method for driving the same
  • Patent Title (中): 半导体集成电路的延迟锁定环路及其驱动方法
  • Application No.: US12938081
    Application Date: 2010-11-02
  • Publication No.: US08344771B2
    Publication Date: 2013-01-01
  • Inventor: Dong-Suk Shin
  • Applicant: Dong-Suk Shin
  • Applicant Address: KR Gyeonggi-do
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: IP & T Group LLP
  • Priority: KR10-2010-0039433 20100428
  • Main IPC: H03L7/06
  • IPC: H03L7/06
Delay locked loop of semiconductor integrated circuit and method for driving the same
Abstract:
A delay locked loop (DLL) of a semiconductor integrated circuit includes a first delay line configured to variably delay a source clock signal and output a locked clock signal, a phase comparator configured to compare the phase of the source clock signal with the phase of a feedback clock signal, a second delay line configured to variably delay the locked clock signal, a first delay controller configured to control the first delay time of the first delay line, a second delay controller configured to control the minimum delay time of the second delay line, and an operation mode controller configured to control the first and second delay controllers in response to an output signal of the phase comparator, and switch operation modes of the first and second delay controllers depending on locking state of the delay lines.
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