Invention Grant
US08344779B2 Comparator circuit with hysteresis, test circuit, and method for testing
有权
具有迟滞的比较器电路,测试电路和测试方法
- Patent Title: Comparator circuit with hysteresis, test circuit, and method for testing
- Patent Title (中): 具有迟滞的比较器电路,测试电路和测试方法
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Application No.: US12871597Application Date: 2010-08-30
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Publication No.: US08344779B2Publication Date: 2013-01-01
- Inventor: Eric W. Tisinger
- Applicant: Eric W. Tisinger
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Daniel D. Hill
- Main IPC: H03K3/00
- IPC: H03K3/00

Abstract:
A comparator has a first input, a second input, an output, a control electrode of a first hysteresis transistor coupled to the output, and a control electrode of a second hysteresis transistor coupled to the output. A method for testing the comparator includes: reconfiguring the comparator to be an amplifier with unity gain feedback; providing an input voltage to the input; providing a first voltage to the first hysteresis transistor to provide a first offset voltage; measuring a first output voltage at the output; removing the first voltage from the first hysteresis transistor; providing the first voltage to the second hysteresis transistor; and measuring a second output voltage at the output.
Public/Granted literature
- US20120049891A1 COMPARATOR CIRCUIT WITH HYSTERESIS, TEST CIRCUIT, AND METHOD FOR TESTING Public/Granted day:2012-03-01
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