Invention Grant
- Patent Title: Method and apparatus for capacitance sensing
- Patent Title (中): 电容检测方法和装置
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Application No.: US12943241Application Date: 2010-11-10
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Publication No.: US08344928B2Publication Date: 2013-01-01
- Inventor: Yannick Guedon , Kien Beng Tan
- Applicant: Yannick Guedon , Kien Beng Tan
- Applicant Address: SG Singapore
- Assignee: STMicroelectronics Asia Pacific PTE Ltd.
- Current Assignee: STMicroelectronics Asia Pacific PTE Ltd.
- Current Assignee Address: SG Singapore
- Agency: Leveque IP Law, P.C.
- Main IPC: H03M1/12
- IPC: H03M1/12

Abstract:
A capacitance-to-digital converter for an extended range of capacitances includes a reference capacitor and one or more offset capacitors. Electrical charge accumulated in the offset capacitors is used to at least partially cancel the charge accumulated in a sensed capacitance to facilitate matching with a charge accumulated in the reference capacitor. The residual charge is passed to an integrator, the output from which is quantized and used to control switching of the capacitors. Immunity to tonal external noises and improved conversion speed are achieved by controlling the capacitor switching with a spread spectrum clock. The capacitance-to-digital converter may be used, for example, for sensing of the capacitances of capacitive elements in touch and proximity displays or other user interfaces.
Public/Granted literature
- US20120112817A1 METHOD AND APPARATUS FOR CAPACITANCE SENSING Public/Granted day:2012-05-10
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