Invention Grant
US08345104B2 System and method for testing image capturing function of an electronic device
失效
用于测试电子设备的图像捕获功能的系统和方法
- Patent Title: System and method for testing image capturing function of an electronic device
- Patent Title (中): 用于测试电子设备的图像捕获功能的系统和方法
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Application No.: US12701550Application Date: 2010-02-06
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Publication No.: US08345104B2Publication Date: 2013-01-01
- Inventor: Qing-Hua Liu , De-Gang Liu
- Applicant: Qing-Hua Liu , De-Gang Liu
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Altis Law Group, Inc.
- Main IPC: H04N17/00
- IPC: H04N17/00 ; H04N5/225

Abstract:
A method for testing an image capturing function of an electronic device includes following blocks. A test program package with an exemplar image is installed in the electronic device. The electronic device is placed on a test fixture used for limiting an image capturing position and an image capturing angle of the electronic device. The electronic device captures an image to be tested by the electronic device. The image to be tested is compared with the exemplar image to determine whether the image capturing function of the electronic device is satisfactory.
Public/Granted literature
- US20110102576A1 SYSTEM AND METHOD FOR TESTING IMAGE CAPTURING FUNCTION OF AN ELECTRONIC DEVICE Public/Granted day:2011-05-05
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