Invention Grant
- Patent Title: Optical inspection system and method
- Patent Title (中): 光学检测系统及方法
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Application No.: US12916315Application Date: 2010-10-29
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Publication No.: US08345232B2Publication Date: 2013-01-01
- Inventor: Lars Markwort , Rajeshwar Chhibber , Klaus Eckerl , Norbert Harendt
- Applicant: Lars Markwort , Rajeshwar Chhibber , Klaus Eckerl , Norbert Harendt
- Applicant Address: DE Unterschleissheim
- Assignee: Nanda Technologies GmbH
- Current Assignee: Nanda Technologies GmbH
- Current Assignee Address: DE Unterschleissheim
- Agency: Silicon Valley Patent Group LLP
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G06K9/00

Abstract:
An inspection system includes imaging optics for imaging an object plane into an image plane. The imaging optics include an objective lens having positive optical power, a first lens group having negative optical power, and a second lens group having positive optical power. The optical elements are arranged along a common unfolded optical axis with a pupil plane of the imaging optics located between the first lens group and the second lens group.
Public/Granted literature
- US20110043796A1 OPTICAL INPSECTION SYSTEM AND METHOD Public/Granted day:2011-02-24
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