Invention Grant
US08345232B2 Optical inspection system and method 有权
光学检测系统及方法

Optical inspection system and method
Abstract:
An inspection system includes imaging optics for imaging an object plane into an image plane. The imaging optics include an objective lens having positive optical power, a first lens group having negative optical power, and a second lens group having positive optical power. The optical elements are arranged along a common unfolded optical axis with a pupil plane of the imaging optics located between the first lens group and the second lens group.
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