Invention Grant
- Patent Title: Optical information analyzing device and optical information analyzing method
- Patent Title (中): 光信息分析装置及光信息分析方法
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Application No.: US13335997Application Date: 2011-12-23
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Publication No.: US08345237B2Publication Date: 2013-01-01
- Inventor: Ken Tsukii , Kenichi Kimura , Toru Takahashi , Jie Xu
- Applicant: Ken Tsukii , Kenichi Kimura , Toru Takahashi , Jie Xu
- Applicant Address: JP Tokyo
- Assignee: Furukawa Electric Co., Ltd.
- Current Assignee: Furukawa Electric Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An optical information analyzing device includes an irradiating unit that irradiates irradiation light to specimens, a transmitted light receiving unit that receives transmitted light and detects the transmitted light as a transmitted light signal, a scattering/fluorescent light receiving unit that receives lateral scattering light and fluorescent light and detects the lateral scattering light and the fluorescent light as a scattering/fluorescent light signal, a nozzle position adjusting mechanism, and an analyzing unit that measures the optical information on the specimen on the basis of the detected transmitted light signal and the detected scattering/fluorescent light signal and analyzes the specimen.
Public/Granted literature
- US20120092667A1 OPTICAL INFORMATION ANALYZING DEVICE AND OPTICAL INFORMATION ANALYZING METHOD Public/Granted day:2012-04-19
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