Invention Grant
- Patent Title: Liquid sample analyzing method
- Patent Title (中): 液体样品分析方法
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Application No.: US12935156Application Date: 2009-03-26
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Publication No.: US08345249B2Publication Date: 2013-01-01
- Inventor: Hideyuki Kurokawa , Koji Miyoshi , Masahiro Aga , Kenji Murakami , Takahiko Tanida , Ryosuke Yamada
- Applicant: Hideyuki Kurokawa , Koji Miyoshi , Masahiro Aga , Kenji Murakami , Takahiko Tanida , Ryosuke Yamada
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- Priority: JP2008-108401 20080418; JP2008-220599 20080829; JP2008-277525 20081029
- International Application: PCT/JP2009/001347 WO 20090326
- International Announcement: WO2009/128205 WO 20091022
- Main IPC: G01N33/48
- IPC: G01N33/48 ; G01N21/00

Abstract:
Provided is a liquid sample analyzing method for analyzing an analyte in a liquid sample by using a test piece (1) on which overflow blocking lines (7) are formed to prevent the liquid sample from flowing to the outside from a passage region (3a) of an extended layer (3). In a state in which the liquid sample is not extended in the passage region (3a) of the extended region (3), the test piece (1) is measured so as to cross the passage region (3a) of the extended layer (3) and the overflow blocking lines (7). Thus in a state in which a difference in brightness is large between the passage region (3a) of the extended region (3) and the overflow blocking lines (7), it is possible to properly recognize the boundary portions between the passage region (3a) of the extended region (3) and the overflow blocking lines (7).
Public/Granted literature
- US20110032525A1 LIQUID SAMPLE ANALYZING METHOD Public/Granted day:2011-02-10
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