Invention Grant
- Patent Title: Displacement/distortion measuring method and displacement/distortion measuring apparatus
- Patent Title (中): 位移/失真测量方法和位移/失真测量仪器
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Application No.: US12158844Application Date: 2006-12-21
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Publication No.: US08345333B2Publication Date: 2013-01-01
- Inventor: Hiroshi Matsuda , Masakazu Uchino , Yukihiro Ito , Kousuke Yoshimaru , Chikara Yamazaki , Shuichi Yamazaki , Kousuke Uchida
- Applicant: Hiroshi Matsuda , Masakazu Uchino , Yukihiro Ito , Kousuke Yoshimaru , Chikara Yamazaki , Shuichi Yamazaki , Kousuke Uchida
- Applicant Address: US IL Rantoul
- Assignee: Smart Structures LLC
- Current Assignee: Smart Structures LLC
- Current Assignee Address: US IL Rantoul
- Agency: Honigman Miller Schwartz and Cohn LLP
- Priority: JP2005-368334 20051221
- International Application: PCT/JP2006/325488 WO 20061221
- International Announcement: WO2007/072905 WO 20070628
- Main IPC: G03F3/08
- IPC: G03F3/08 ; G06K15/00 ; G06K9/00 ; G02B27/42 ; G01B11/14
Abstract:
Provided are a displacement/distortion measuring method and a displacement/distortion measuring apparatus for easily and highly accurately measuring displacement or distortion of an object. An image of the surface of the measuring object is picked up by a line scanner apparatus adhered or brought close to the surface of the measuring object. The image is taken, displacement or distortion is measured by image analysis of the image of the measuring object surface prior to time lapse and that after time lapse, and displacement or distortion measuring results are outputted.
Public/Granted literature
- US20090284804A1 Displacement/Distortion Measuring Method and Displacement/Distortion Measuring Apparatus Public/Granted day:2009-11-19
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