Invention Grant
US08345441B1 Stub minimization for multi-die wirebond assemblies with parallel windows
有权
具有平行窗口的多芯片焊接组件的短截线最小化
- Patent Title: Stub minimization for multi-die wirebond assemblies with parallel windows
- Patent Title (中): 具有平行窗口的多芯片焊接组件的短截线最小化
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Application No.: US13337575Application Date: 2011-12-27
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Publication No.: US08345441B1Publication Date: 2013-01-01
- Inventor: Richard Dewitt Crisp , Wael Zohni , Belgacem Haba , Frank Lambrecht
- Applicant: Richard Dewitt Crisp , Wael Zohni , Belgacem Haba , Frank Lambrecht
- Applicant Address: US CA San Jose
- Assignee: Invensas Corporation
- Current Assignee: Invensas Corporation
- Current Assignee Address: US CA San Jose
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Main IPC: H01R12/16
- IPC: H01R12/16

Abstract:
A microelectronic assembly can include first and second microelectronic packages mounted to respective first and second opposed surfaces of a circuit panel. Each microelectronic package can include a substrate having first and second apertures extending between first and second surfaces thereof, first and second microelectronic elements each having a surface facing the first surface of the substrate and a plurality of contacts at the surface of the respective microelectronic element aligned with at least one of the apertures, a plurality of terminals exposed at the second surface in a central region thereof, and leads electrically connected between the contacts of each microelectronic element and the terminals. The apertures of each substrate can have first and second parallel axes extending in directions of the lengths of the respective apertures. The terminals of each microelectronic package can be configured to carry all of the address signals transferred to the respective microelectronic package.
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