Invention Grant
- Patent Title: Methods for segmented programming and memory devices
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Application No.: US12968714Application Date: 2010-12-15
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Publication No.: US08345482B2Publication Date: 2013-01-01
- Inventor: Jung-Sheng Hoei
- Applicant: Jung-Sheng Hoei
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
Methods for segmented programming, program verify, and memory devices are disclosed. One such method for programming includes biasing memory cells with a programming voltage and program verifying the memory cells with a plurality of ramped voltage signal segments, wherein each ramped voltage signal segment has a different start voltage and a different end voltage than the other ramped voltage signal segments.
Public/Granted literature
- US20120159277A1 METHODS FOR SEGMENTED PROGRAMMING AND MEMORY DEVICES Public/Granted day:2012-06-21
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