Invention Grant
US08345492B2 Memory controller for detecting read latency, memory system and test system having the same 有权
用于检测读延迟的存储器控​​制器,具有该延迟的存储器系统和测试系统

Memory controller for detecting read latency, memory system and test system having the same
Abstract:
A memory controller includes an I/O circuit, a read latency detector and a clock domain synchronizer. The I/O circuit transmits a first signal to a semiconductor memory device, receives a reflected signal returned from the semiconductor memory device, and delays the reflected signal in response to a delay selection signal to generate a second signal. The reflected signal is provided by reflection of the first signal from the semiconductor memory device. The read latency detector generates the first signal in response to a system clock signal, and generates a read latency signal in response to the system clock signal, a hold signal, and the second signal. The clock domain synchronizer generates the delay selection signal and the hold signal in response to the system clock signal and the second signal.
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