Invention Grant
US08345492B2 Memory controller for detecting read latency, memory system and test system having the same
有权
用于检测读延迟的存储器控制器,具有该延迟的存储器系统和测试系统
- Patent Title: Memory controller for detecting read latency, memory system and test system having the same
- Patent Title (中): 用于检测读延迟的存储器控制器,具有该延迟的存储器系统和测试系统
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Application No.: US12781846Application Date: 2010-05-18
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Publication No.: US08345492B2Publication Date: 2013-01-01
- Inventor: Hun-Dae Choi , Young-Chan Jang
- Applicant: Hun-Dae Choi , Young-Chan Jang
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2009-0044879 20090522
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A memory controller includes an I/O circuit, a read latency detector and a clock domain synchronizer. The I/O circuit transmits a first signal to a semiconductor memory device, receives a reflected signal returned from the semiconductor memory device, and delays the reflected signal in response to a delay selection signal to generate a second signal. The reflected signal is provided by reflection of the first signal from the semiconductor memory device. The read latency detector generates the first signal in response to a system clock signal, and generates a read latency signal in response to the system clock signal, a hold signal, and the second signal. The clock domain synchronizer generates the delay selection signal and the hold signal in response to the system clock signal and the second signal.
Public/Granted literature
- US20100296352A1 MEMORY CONTROLLER FOR DETECTING READ LATENCY, MEMORY SYSTEM AND TEST SYSTEM HAVING THE SAME Public/Granted day:2010-11-25
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