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US08345497B2 Internal bypassing of memory array devices 有权
内存阵列设备的内部旁路

Internal bypassing of memory array devices
Abstract:
An output control circuit for a memory array includes a latched output node precharged to a first logic state prior to both a read and write operation; first logic that couples memory cell data from a memory read path to the output node during the read operation, the first logic controlled by a timing signal; second logic that internally bypasses the memory read path during a write operation by decoupling it from the output node, such that a logical derivative of write data written to the memory array is also coupled to the output node, the second logic also controlled by the timing signal; and wherein a transition of the output node from the first logic state to a second logic state during the write operation occurs within a time range as that of the same transition during the read operation.
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