Invention Grant
- Patent Title: X-ray optical configuration with two focusing elements
- Patent Title (中): 具有两个聚焦元件的X射线光学配置
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Application No.: US12926607Application Date: 2010-11-30
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Publication No.: US08345822B2Publication Date: 2013-01-01
- Inventor: Christoph Ollinger
- Applicant: Christoph Ollinger
- Applicant Address: DE Karlsruhe
- Assignee: Bruker AXS GmbH
- Current Assignee: Bruker AXS GmbH
- Current Assignee Address: DE Karlsruhe
- Agent Paul Vincent
- Priority: DE102009047672 20091208
- Main IPC: G21K1/06
- IPC: G21K1/06

Abstract:
An X-ray optical configuration (1), comprising a position for an X-ray source (2), a position for a sample (3), a first focusing element (4) for directing X-ray radiation from the position of the X-ray source (2) via an intermediate focus (5) onto the position of the sample (3), and an X-ray detector (6) that can be moved on a circular arc (7) of radius R around the position of the sample (3), is characterized in that the configuration also comprises a second focusing element (8) for directing part of the X-ray radiation emanating from the intermediate focus (5) onto the position of the sample (3), and an aperture system (9) for selecting between illumination of the position of the sample (3) exclusively and directly from the intermediate focus (5) (=first optical path (10′)), or exclusively via the second focusing element (8) (=second optical path (10″)). The configuration facilitates changing between reflection geometry and transmission geometry, in particular, wherein modification and adjustment devices are minimized or unnecessary.
Public/Granted literature
- US20110135059A1 X-ray optical configuration with two focusing elements Public/Granted day:2011-06-09
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