Invention Grant
- Patent Title: X-ray metering apparatus, and X-ray metering method
- Patent Title (中): X射线计量装置和X射线计量方法
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Application No.: US12667500Application Date: 2008-07-01
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Publication No.: US08345824B2Publication Date: 2013-01-01
- Inventor: Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
- Applicant: Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: IHI Corporation,The University of Tokyo
- Current Assignee: IHI Corporation,The University of Tokyo
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Griffin & Szipl, P.C.
- Priority: JP2007-175739 20070704
- International Application: PCT/JP2008/061906 WO 20080701
- International Announcement: WO2009/005061 WO 20090108
- Main IPC: G21G4/00
- IPC: G21G4/00

Abstract:
An X-ray waveform is generated by validating detection data corresponding to when an X-ray (4) is generated at a collision point (9) among X-ray detection data and invalidating other data. For example, when laser light (3) is pulse laser light and an electron beam (1) is a continuous electron beam or a pulse-like electron beam having a pulse width equal to or greater than that of the pulse laser light, the X-ray waveform is generated by detecting the laser light (3) and multiplying the X-ray detection data by laser light detection data after making time axes coincident with respect to the collision point (9).
Public/Granted literature
- US20110026679A1 X-RAY METERING APPARATUS, AND X-RAY METERING METHOD Public/Granted day:2011-02-03
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