Invention Grant
US08345979B2 Methods for finding and characterizing a deformed pattern in an image
有权
用于查找和表征图像中的变形图案的方法
- Patent Title: Methods for finding and characterizing a deformed pattern in an image
- Patent Title (中): 用于查找和表征图像中的变形图案的方法
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Application No.: US11670199Application Date: 2007-02-01
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Publication No.: US08345979B2Publication Date: 2013-01-01
- Inventor: Jason Davis
- Applicant: Jason Davis
- Applicant Address: US CA Mt. View
- Assignee: Cognex Technology and Investment Corporation
- Current Assignee: Cognex Technology and Investment Corporation
- Current Assignee Address: US CA Mt. View
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/46

Abstract:
A method is disclosed for finding a deformed pattern in an image using a plurality of sub-patterns. By advantageously restricting sub-pattern search ranges, search speed is improved, and the incidence of spurious matches is reduced. The method also quickly decides which sub-pattern result, of several potential candidates, is most likely to be the correct match for a deformed sub-pattern. Also, a method is provided for characterizing a deformed pattern in an image by using results from feature-based search tools to create a mapping that models the deformation of the pattern. A transform, selectable by a user, is fit to the results from the search tools to create a global deformation mapping. This transformation is fit only to feature points derived from matches resulting from successful sub-pattern search, without including data from areas of the pattern that were blank, not matched, or otherwise didn't contain information about the pattern's distorted location.
Public/Granted literature
- US20070183668A1 Methods for finding and characterizing a deformed pattern in an image Public/Granted day:2007-08-09
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