Invention Grant
- Patent Title: Determination of a field referencing pattern
- Patent Title (中): 确定字段引用模式
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Application No.: US12465673Application Date: 2009-05-14
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Publication No.: US08345996B2Publication Date: 2013-01-01
- Inventor: Arun Shankar Kudana , Soyeb Nagori
- Applicant: Arun Shankar Kudana , Soyeb Nagori
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Mirna Abyad; W. James Brady; Frederick J. Telecky, Jr.
- Main IPC: G06K9/36
- IPC: G06K9/36 ; H04N7/26 ; G06K9/46

Abstract:
Several methods and a system to perform determination of a field referencing pattern are disclosed. In one aspect, a method is disclosed. A motion vector of a previously coded frame is analyzed using a processor and a memory. A statistic is updated based on whether the motion vector includes one or more of a fractional pel vertical component, a half pel vertical component, and an integer pel vertical component. A field referencing pattern of a target field is determined based on the statistic and an exception protocol.
Public/Granted literature
- US20100002944A1 DETERMINATION OF A FIELD REFERENCING PATTERN Public/Granted day:2010-01-07
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