Invention Grant
- Patent Title: Surface inspecting device
- Patent Title (中): 表面检测装置
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Application No.: US12509146Application Date: 2009-07-24
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Publication No.: US08346425B2Publication Date: 2013-01-01
- Inventor: Kai-Yuan Ku , Shih-Chung Kang , Shang-Hsien Hsieh , Jia-Ruey Chang , Peter Liu
- Applicant: Kai-Yuan Ku , Shih-Chung Kang , Shang-Hsien Hsieh , Jia-Ruey Chang , Peter Liu
- Applicant Address: TW Taipei
- Assignee: National Taiwan University
- Current Assignee: National Taiwan University
- Current Assignee Address: TW Taipei
- Priority: TW97146437A 20081128
- Main IPC: F16H48/06
- IPC: F16H48/06

Abstract:
A modular surface inspecting device is provided. A modular surface inspecting device comprises a computing layer having a processing unit in which a modular service-oriented software is installed; a detecting layer having a plurality of sensors obtaining a plurality of surrounding information; and a dynamic layer carrying the computing layer and the detecting layer and controlled by a controlling command generated by the computing layer according to the plurality of surrounding information.
Public/Granted literature
- US20100138097A1 Surface Inspecting Device Public/Granted day:2010-06-03
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