Invention Grant
- Patent Title: Programmable device testing
- Patent Title (中): 可编程器件测试
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Application No.: US12574154Application Date: 2009-10-06
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Publication No.: US08346498B2Publication Date: 2013-01-01
- Inventor: David Beecher
- Applicant: David Beecher
- Applicant Address: US DE Wilmington
- Assignee: Leannoux Properties AG L.L.C.
- Current Assignee: Leannoux Properties AG L.L.C.
- Current Assignee Address: US DE Wilmington
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/14

Abstract:
According to some embodiments, characterization data can be loaded onto a programmable device. The characterization data can be configured to cause the programmable device to perform one or more functions if executed on the programmable device. It can then be determined whether or not loading the characterization data onto the programmable device caused the programmable device to be successfully programmed. An indication can be transmitted for receipt by an external device, the indication indicating whether or not the programmable device was successfully programmed.
Public/Granted literature
- US20100023819A1 Programmable Device Testing Public/Granted day:2010-01-28
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