Invention Grant
- Patent Title: Pattern classification method
- Patent Title (中): 模式分类方法
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Application No.: US12374076Application Date: 2007-07-17
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Publication No.: US08346684B2Publication Date: 2013-01-01
- Inventor: Bruno Mirbach , Pandu Devarakota
- Applicant: Bruno Mirbach , Pandu Devarakota
- Applicant Address: LU Luxembourg
- Assignee: IEE International Electronics & Engineering S.A.
- Current Assignee: IEE International Electronics & Engineering S.A.
- Current Assignee Address: LU Luxembourg
- Agency: Cantor Colburn LLP
- Priority: EP06118110 20060728
- International Application: PCT/EP2007/057374 WO 20070717
- International Announcement: WO2008/012241 WO 20080131
- Main IPC: G06F15/18
- IPC: G06F15/18

Abstract:
For assigning a test pattern to a class chosen from a predefined set of classes, the class membership probability for the test pattern is calculated as well as the confidence interval for the class membership probability based upon a number of training patterns in a neighborhood of the test pattern in the feature space. The number of training patterns in the neighborhood of the test pattern is obtained from computing a convolution of a density function of the training patterns with a Gaussian smoothing function centered on the test pattern, where the density function of the training patterns is represented as a mixture of Gaussian functions. The convolution of the smoothing function and the mixture of Gaussian functions can be expressed analytically.
Public/Granted literature
- US20090319451A1 PATTERN CLASSIFICATION METHOD Public/Granted day:2009-12-24
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