Invention Grant
- Patent Title: Non-disruptive I/O adapter diagnostic testing
- Patent Title (中): 无中断I / O适配器诊断测试
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Application No.: US13050372Application Date: 2011-03-17
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Publication No.: US08347142B2Publication Date: 2013-01-01
- Inventor: Rafael G. Cabezas , David D. Galvin , Binh K. Hua , Sivarama K. Kodukula
- Applicant: Rafael G. Cabezas , David D. Galvin , Binh K. Hua , Sivarama K. Kodukula
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Yudell Isidore Ng Russell PLLC
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A primary I/O adapter and a redundant I/O adapter of a data processing system are assigned to support access to a system resource. While the primary I/O adapter is in service and the redundant I/O adapter is not in service in providing access to the system resource, a fail over command is issued to remove the primary I/O adapter from service and place the redundant I/O adapter in service in supporting access to the system resource. While the redundant I/O adapter is in service and the primary I/O adapter is not in service in providing access to the system resource, diagnostic testing on the primary I/O adapter is performed. In response to the diagnostic testing revealing no fault in the primary I/O adapter, a fail back command is issued to restore the primary I/O adapter to service and to remove the redundant I/O adapter from service.
Public/Granted literature
- US20110167293A1 NON-DISRUPTIVE I/O ADAPTER DIAGNOSTIC TESTING Public/Granted day:2011-07-07
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