Invention Grant
US08347183B2 Flash memory device using ECC algorithm and method of operating the same
有权
闪存设备使用ECC算法和操作方法相同
- Patent Title: Flash memory device using ECC algorithm and method of operating the same
- Patent Title (中): 闪存设备使用ECC算法和操作方法相同
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Application No.: US12486875Application Date: 2009-06-18
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Publication No.: US08347183B2Publication Date: 2013-01-01
- Inventor: Chi-weon Yoon , Chae-hoon Kim
- Applicant: Chi-weon Yoon , Chae-hoon Kim
- Applicant Address: KR Suwon-Si, Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2008-0060223 20080625
- Main IPC: H03M13/00
- IPC: H03M13/00

Abstract:
A flash memory device using an error correction code (ECC) algorithm and a method of operating the same. The device includes a memory cell array including a error correction code (ECC) block including data memory cells configured to store data and a parity cell configured to store a first parity code, a parity controller configured to generate a second parity code based on a the current operating mode of the flash memory device, and an error correction unit configured to receive one of the first and second parity codes and to perform an ECC algorithm on the data stored in the data memory cells using the received parity code. A control logic restarts an erase operation on an erroneously unerased data memory cell or prevents the erase operation from being restarted based on the number of erroneous bits per ECC block.
Public/Granted literature
- US20090327839A1 FLASH MEMORY DEVICE USING ECC ALGORITHM AND METHOD OF OPERATING THE SAME Public/Granted day:2009-12-31
Information query
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