Invention Grant
- Patent Title: Resonance compensation in scanning probe microscopy
- Patent Title (中): 扫描探针显微镜共振补偿
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Application No.: US12785840Application Date: 2010-05-24
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Publication No.: US08347409B2Publication Date: 2013-01-01
- Inventor: Daniel James Burns , Georg Ernest Fantner , Kamal Youcef-Toumi
- Applicant: Daniel James Burns , Georg Ernest Fantner , Kamal Youcef-Toumi
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Occhiuti Rohlicek & Tsao LLP
- Main IPC: G01Q30/06
- IPC: G01Q30/06 ; G01Q10/06 ; G01Q10/04

Abstract:
A method includes generating, using a sensor, a data signal. The data signal includes a first component based on a motion in a first direction of an actuator configured to provide motion between a sample and a probe in the first direction, the first direction substantially in the plane of the sample; and a second component based on at least one of topographic variations of the sample in a second direction, and a materials property of the sample. The method further includes generating, using a processor, a compensatory signal based on the first component of the data signal generated by the sensor; and providing the compensatory signal to the actuator.
Public/Granted literature
- US20110289635A1 RESONANCE COMPENSATION IN SCANNING PROBE MICROSCOPY Public/Granted day:2011-11-24
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