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US08354290B2 Ultrananocrystalline diamond films with optimized dielectric properties for advanced RF MEMS capacitive switches 有权
超高分子金刚石薄膜具有优化的介电性能,适用于先进的RF MEMS电容开关

Ultrananocrystalline diamond films with optimized dielectric properties for advanced RF MEMS capacitive switches
Abstract:
An efficient deposition process is provided for fabricating reliable RF MEMS capacitive switches with multilayer ultrananocrystalline (UNCD) films for more rapid recovery, charging and discharging that is effective for more than a billion cycles of operation. Significantly, the deposition process is compatible for integration with CMOS electronics and thereby can provide monolithically integrated RF MEMS capacitive switches for use with CMOS electronic devices, such as for insertion into phase array antennas for radars and other RF communication systems.
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