Invention Grant
US08354315B2 Fabrication method of a power semicondutor structure with schottky diode
有权
具有肖特基二极管的功率半导体结构的制造方法
- Patent Title: Fabrication method of a power semicondutor structure with schottky diode
- Patent Title (中): 具有肖特基二极管的功率半导体结构的制造方法
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Application No.: US12821501Application Date: 2010-06-23
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Publication No.: US08354315B2Publication Date: 2013-01-15
- Inventor: Hsiu Wen Hsu , Chun Ying Yeh
- Applicant: Hsiu Wen Hsu , Chun Ying Yeh
- Applicant Address: TW Taipei County
- Assignee: Great Power Semiconductor Corp.
- Current Assignee: Great Power Semiconductor Corp.
- Current Assignee Address: TW Taipei County
- Agency: Rosenberg, Klein & Lee
- Main IPC: H01L21/8234
- IPC: H01L21/8234

Abstract:
A power semiconductor structure with schottky diode is provided. In the step of forming the gate structure, a separated first polysilicon structure is also formed on the silicon substrate. Then, the silicon substrate is implanted with dopants by using the first polysilicon structure as a mask to form a body and a source region. Afterward, a dielectric layer is deposited on the silicon substrate and an open penetrating the dielectric layer and the first polysilicon structure is formed so as to expose the source region and the drain region below the body. The depth of the open is smaller than the greatest depth of the body. Then, a metal layer is filled into the open to electrically connect to the source region and the drain region.
Public/Granted literature
- US20110316077A1 POWER SEMICONDUCTOR STRUCTURE WITH SCHOTTKY DIODE AND FABRICATION METHOD THEREOF Public/Granted day:2011-12-29
Information query
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