Invention Grant
- Patent Title: Semiconductor structure and manufacturing method of the same
- Patent Title (中): 半导体结构及其制造方法相同
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Application No.: US12990990Application Date: 2010-09-19
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Publication No.: US08354343B2Publication Date: 2013-01-15
- Inventor: Huilong Zhu , Haizhou Yin , Zhijiong Luo
- Applicant: Huilong Zhu , Haizhou Yin , Zhijiong Luo
- Applicant Address: CN Beijing
- Assignee: Institute of Microelectronics, Chinese Academy of Sciences
- Current Assignee: Institute of Microelectronics, Chinese Academy of Sciences
- Current Assignee Address: CN Beijing
- Agency: Westman, Champlin & Kelly, P.A.
- Priority: CN201010162118 20100428
- International Application: PCT/CN2010/001438 WO 20100919
- International Announcement: WO2011/134128 WO 20111103
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
The present invention provides a semiconductor structure and a manufacturing method thereof. The method comprises: providing a semiconductor substrate comprising semiconductor devices; depositing a copper diffusion barrier layer on the semiconductor substrate; forming a copper composite layer on the copper diffusion barrier layer; decomposing the copper composite at corresponding positions, where copper interconnection is to be formed, into copper according to the shape of the copper interconnection; and etching off the undecomposed copper composite and the copper diffusion barrier layer underneath, to interconnect the semiconductor devices. The present invention is adaptive for manufacturing interconnection in integrated circuits.
Public/Granted literature
- US20120292766A2 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD OF THE SAME Public/Granted day:2012-11-22
Information query
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