Invention Grant
US08354343B2 Semiconductor structure and manufacturing method of the same 有权
半导体结构及其制造方法相同

Semiconductor structure and manufacturing method of the same
Abstract:
The present invention provides a semiconductor structure and a manufacturing method thereof. The method comprises: providing a semiconductor substrate comprising semiconductor devices; depositing a copper diffusion barrier layer on the semiconductor substrate; forming a copper composite layer on the copper diffusion barrier layer; decomposing the copper composite at corresponding positions, where copper interconnection is to be formed, into copper according to the shape of the copper interconnection; and etching off the undecomposed copper composite and the copper diffusion barrier layer underneath, to interconnect the semiconductor devices. The present invention is adaptive for manufacturing interconnection in integrated circuits.
Public/Granted literature
Information query
Patent Agency Ranking
0/0