Invention Grant
- Patent Title: VDMOS and JFET integrated semiconductor device
- Patent Title (中): VDMOS和JFET集成半导体器件
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Application No.: US12828366Application Date: 2010-07-01
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Publication No.: US08354698B2Publication Date: 2013-01-15
- Inventor: Hsin-Chih Chiang , Han-Chung Tai
- Applicant: Hsin-Chih Chiang , Han-Chung Tai
- Applicant Address: TW Taipei
- Assignee: System General Corp.
- Current Assignee: System General Corp.
- Current Assignee Address: TW Taipei
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H01L29/80
- IPC: H01L29/80

Abstract:
A semiconductor device. The semiconductor comprises a substrate, a VDMOS, a JFET, a first electrode, a second electrode, a third electrode and a fourth electrode. The VDMOS is formed in the substrate. The JFET is formed in the substrate. The first electrode, the second electrode and a third electrode are connected to the VDMOS and used as a first gate electrode, a first drain electrode and a first source electrode of the VDMOS respectively. The second electrode, the third electrode and the fourth electrode are connected to the JFET and used as a second drain electrode, a second gate electrode and a second source electrode of the JFET respectively.
Public/Granted literature
- US20110180858A1 Semiconductor Device Public/Granted day:2011-07-28
Information query
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