Invention Grant
- Patent Title: Semiconductor component with improved robustness
- Patent Title (中): 半导体元件具有改进的鲁棒性
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Application No.: US11865316Application Date: 2007-10-01
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Publication No.: US08354709B2Publication Date: 2013-01-15
- Inventor: Hans-Joachim Schulze , Josef Lutz
- Applicant: Hans-Joachim Schulze , Josef Lutz
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Dicke, Billig & Czaja, PLLC
- Priority: DE102006046845 20061002
- Main IPC: H01L29/66
- IPC: H01L29/66

Abstract:
One aspect is a semiconductor component including a terminal zone; a drift zone of a first conduction type, which is doped more weakly than the terminal zone; a component junction between the drift zone and a further component zone; and a charge carrier compensation zone of the first conduction type, which is arranged between the drift zone and the terminal zone and whose doping concentration is lower than that of the terminal zone, and whose doping concentration increases at least in sections in the direction of the terminal zone from a minimum doping concentration to a maximum doping concentration, the minimum doping concentration being more than 1016 cm−3.
Public/Granted literature
- US20080128798A1 SEMICONDUCTOR COMPONENT WITH IMPROVED ROBUSTNESS Public/Granted day:2008-06-05
Information query
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