Invention Grant
- Patent Title: Method and device for humidity and/or density measurement
- Patent Title (中): 用于湿度和/或密度测量的方法和装置
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Application No.: US12740724Application Date: 2008-11-19
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Publication No.: US08354849B2Publication Date: 2013-01-15
- Inventor: Hendrik Richter
- Applicant: Hendrik Richter
- Applicant Address: DE Hamburg
- Assignee: TEWS Elektronik GmbH & Co. KG
- Current Assignee: TEWS Elektronik GmbH & Co. KG
- Current Assignee Address: DE Hamburg
- Agency: Vidas, Arrett & Steinkraus, P.A.
- Priority: DE102007057092 20071120
- International Application: PCT/EP2008/009775 WO 20081119
- International Announcement: WO2009/065568 WO 20090528
- Main IPC: G01N22/04
- IPC: G01N22/04

Abstract:
A method for the measurement of humidity and/or density in a measurement target. The phase and the amplitude of the microwave radiation transmitted through the measurement target is determined for a number of frequencies. The complex-valued transmission function of the measurement target is calculated from the determined values using the complex-valued transfer function of the measurement arrangement, and transformed into the time domain as a complex-valued time domain function. The point in time at which the amount of the main pulse has its maximum value is determined as a characteristic variable A from the time domain function. From the time domain function, the width of the main pulse is determined as a characteristic variable B, and/or the amplitude value of the main pulse as a characteristic variable H. A humidity and/or density of the measurement target is determined depending on the characteristic variable A and the characteristic variables B and/or H.
Public/Granted literature
- US20100295556A1 Method and Device for Humidity and/or Density Measurement Public/Granted day:2010-11-25
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