A system for testing a DC power supply performance includes a test apparatus for testing the DC power supply, and a control circuit electrically coupled to the DC power supply and test apparatus. The control circuit includes a microcontroller, a switch control circuit, and a switch circuit controlled by the switch control circuit. The microcontroller is configured for outputting control signals. The switch control circuit is configured for receiving the control signals, and is powered on according to the corresponding control signals. The switch circuit is capable of turning on when the switch control circuit is powered on. The DC power supply output terminals are coupled electrically to the test apparatus via the switch circuit. The test apparatus is configured for reading voltage values at the DC power supply corresponding output terminals, and outputting a feedback signal to the microcontroller when the testing is complete.